PEOPLE
GAO Yao 高堯
GAO Yao / Research Assistant Professor
PHONE: (852) 3943 4148
EMAIL: yaogao@cuhk.edu.hk
OFFICE: Room 224, 2/F, Science Centre North Block
ORCID: 0000-0001-8308-4729
Education
- Ph.D., The Hong Kong University of Science and Technology, China, 2016
- B. Sci., Xiamen University, China, 2011
Position
- 2023-now, Research Assistant Professor, Department of Physics, The Chinese University of Hong Kong
- 2022-2023, Research Associate, Department of Physics, The Chinese University of Hong Kong
- 2019-2022, Research Associate, Department of Applied Physics, The Hong Kong Polytechnic University
- 2016-2017, 2018-2019, Research Associate, Department of Mechanical Engineering, The Hong Kong Polytechnic University
Research Interests
- AFM-based nanomechanical testing of 1D/2D nanomaterials and surfaces/interfaces
- Mechanical probing of the solid electrolyte interphase in secondary batteries
- Quantum sensing for energy applications
Honours and Awards
- Xiamen University Outstanding Graduate Student (2011)
- National Scholarship, Ministry of Education of China (2010-2011)
- BMW Outstanding Student Award (2009-2010)
- Xiamen University CUBIC Award (2009-2010)
- National Scholarship, Ministry of Education of China (2008-2009)
Selected Recent Publications
- Yao Gao, Biao Zhang*, Probing the mechanically stable solid electrolyte interphase and the implications in design strategies Advanced Materials, 2022. DOI: https://doi.org/10.1002/adma.202205421
- Yao Gao, Xiaoqiong Du, Zhen Hou, Xi Shen, Yiu-Wing Mai, Jean-Marie Tarascon, Biao Zhang*, Unraveling the mechanical origin of stable solid electrolyte interphase Joule, 2021, 5(7), 1860-1872
- Zhen Hou#, Yao Gao#, Hong Tan, Biao Zhang*, Realizing high-power and high-capacity zinc/sodium metal anodes through interfacial chemistry regulation Nature Communication, 2021, 12(1), 1-10. (# indicates equal authorship)
- Yao Gao, Sanqiang Shi and Tong-yi Zhang*. Adhesion contact deformation in Nanobridge Tests Nanoscale 2017, 9, 6033-6040
- Yao Gao, Yijing Sun and Tong-yi Zhang. Highly reliable and efficient atomic force microscopy based bending test for assessing Young’s modulus of one-dimensional nanomaterials Applied Physical Letters, 2016, 108, 123104